Difference between revisions of "XCCA"
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==References== | ==References== | ||
+ | * [Detecting orientational order in model systems by X-ray cross-correlation methods Detecting orientational order in model systems by X-ray cross-correlation methods] ''J. Appl. Cryst.'' '''2014''', 47, 1315-1323. [https://doi.org/10.1107/S1600576714012424 doi: 10.1107/S1600576714012424] | ||
* Lehmkühler, F.; Fischer, B.; Müller, L.; Ruta B.; Grübel, G. [http://scripts.iucr.org/cgi-bin/paper?zg5001 Structure beyond pair correlations: X-ray cross-correlation from colloidal crystals] ''Journal of Applied Crystallography'' '''2016''', 49, [https://doi.org/10.1107/S1600576716017313 doi: 10.1107/S1600576716017313] | * Lehmkühler, F.; Fischer, B.; Müller, L.; Ruta B.; Grübel, G. [http://scripts.iucr.org/cgi-bin/paper?zg5001 Structure beyond pair correlations: X-ray cross-correlation from colloidal crystals] ''Journal of Applied Crystallography'' '''2016''', 49, [https://doi.org/10.1107/S1600576716017313 doi: 10.1107/S1600576716017313] | ||
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==See Also== | ==See Also== |
Revision as of 16:28, 11 November 2016
X-ray cross-correlation analysis (XCCA) is a suite of techniques for analyzing correlations within x-ray scattering datasets. In particular, analysis of angular correlations within the 2D detector image can be used to isolate structural information that would be lost in a conventional circular-averaged 1D curve. Thus, even for nominally isotropic materials (powder-like sample), information about local symmetry (and thus packing motifs or unit cell) can be extracted from the data.
References
- [Detecting orientational order in model systems by X-ray cross-correlation methods Detecting orientational order in model systems by X-ray cross-correlation methods] J. Appl. Cryst. 2014, 47, 1315-1323. doi: 10.1107/S1600576714012424
- Lehmkühler, F.; Fischer, B.; Müller, L.; Ruta B.; Grübel, G. Structure beyond pair correlations: X-ray cross-correlation from colloidal crystals Journal of Applied Crystallography 2016, 49, doi: 10.1107/S1600576716017313
See Also
- X-ray Photon Correlation Spectroscopy (XPCS)
- Fluctuation X-ray Scattering (FXS)
- Variance Scattering (VS)
- Ring graininess analysis (to determine grain count, grain size and size-distribution, crystallinity, etc.)
- Yager, K.G.; Majewski, P.W. Metrics of graininess: robust quantification of grain count from the non-uniformity of scattering rings Journal of Applied Crystallography 2014, 47, 1855–1865. doi: 10.1107/S1600576714020822
- Ring graininess analysis (to determine grain count, grain size and size-distribution, crystallinity, etc.)