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| − | '''X-ray cross-correlation analysis''' ('''XCCA''') is a suite of techniques for analyzing correlations within [[x-ray]] [[scattering]] datasets. In particular, analysis of angular correlations within the 2D detector image can be used to isolate structural information that would be lost in a conventional circular-averaged 1D curve. Thus, even for nominally isotropic materials (powder-like sample), information about local symmetry (and thus packing motifs or [[unit cell]]) can be extracted from the data.
| + | #REDIRECT [[Correlation methods]] |
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| − | ==References==
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| − | * M. Altarelli, R. P. Kurta, and I. A. Vartanyants [http://journals.aps.org/prb/abstract/10.1103/PhysRevB.82.104207 X-ray cross-correlation analysis and local symmetries of disordered systems: General theory] ''Phys. Rev. B.'' '''2010''', 82, 104207. [http://dx.doi.org/10.1103/PhysRevB.82.104207 doi: 10.1103/PhysRevB.82.104207]
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| − | * R P Kurta, R Dronyak, M Altarelli, E Weckert and I A Vartanyants [http://iopscience.iop.org/article/10.1088/1367-2630/15/1/013059/meta Solution of the phase problem for coherent scattering from a disordered system of identical particles] ''New Journal of Physics'' '''2013''', 15. [http://dx.doi.org/10.1088/1367-2630/15/1/013059 doi: 10.1088/1367-2630/15/1/013059]
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| − | * F. Lehmkühler, G. Grübel and C. Gutt [Detecting orientational order in model systems by X-ray cross-correlation methods Detecting orientational order in model systems by X-ray cross-correlation methods Detecting orientational order in model systems by X-ray cross-correlation methods] ''J. Appl. Cryst.'' '''2014''', 47, 1315-1323. [https://doi.org/10.1107/S1600576714012424 doi: 10.1107/S1600576714012424]
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| − | * Lehmkühler, F.; Fischer, B.; Müller, L.; Ruta B.; Grübel, G. [http://scripts.iucr.org/cgi-bin/paper?zg5001 Structure beyond pair correlations: X-ray cross-correlation from colloidal crystals] ''Journal of Applied Crystallography'' '''2016''', 49, [https://doi.org/10.1107/S1600576716017313 doi: 10.1107/S1600576716017313]
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| − | ==See Also==
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| − | * [[X-ray Photon Correlation Spectroscopy]] ([[XPCS]])
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| − | * [[Fluctuation X-ray Scattering]] (FXS)
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| − | * [[Variance Scattering]] (VS)
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| − | ** [[Ring graininess]] analysis (to determine grain count, grain size and size-distribution, crystallinity, etc.)
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| − | *** [[Yager, K.G.]]; Majewski, P.W. [http://scripts.iucr.org/cgi-bin/paper?S1600576714020822 Metrics of graininess: robust quantification of grain count from the non-uniformity of scattering rings] ''Journal of Applied Crystallography'' '''2014''', 47, 1855–1865. [http://dx.doi.org/10.1107/S1600576714020822 doi: 10.1107/S1600576714020822]
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