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| − | Sharp intersecting lines are sometimes observed in [[scattering]] data for single-crystal materials (e.g. if one's sample is supported on a [[Material:Silicon|silicon]] substrate). In electron microscopy, these are called '''Kikuchi patterns''', while in x-ray scattering there may be called '''Kossel lines'''.
| + | #REDIRECT [[Multiple scattering]] |
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| − | These arise from the intersection of the detector plane ([[Ewald sphere]]) with the [[reciprocal-space]] scattering.
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| − | ==See Also==
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| − | * W. G. Morris [http://scitation.aip.org/content/aip/journal/jap/39/3/10.1063/1.1656436 Crystal orientation and lattice parameters from Kossel lines] ''J. Appl. Phys.'' '''1968''', 39, 1813–1823. [http://dx.doi.org/10.1063/1.1656436 doi: 10.1063/1.1656436]
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| − | * G. Nolze, C. Grosse and A. Winkelmann [http://scripts.iucr.org/cgi-bin/paper?vh5033 Kikuchi pattern analysis of noncentrosymmetric crystals] ''J. Appl. Cryst.'' '''2015''', 48. [http://dx.doi.org/10.1107/S1600576715014016 doi: 10.1107/S1600576715014016]
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