Difference between revisions of "Reciprocal-space mapping"
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==See Also== | ==See Also== | ||
* [[CD-SAXS]] and [[RSANS]] | * [[CD-SAXS]] and [[RSANS]] | ||
| + | * [[Pole figure]] | ||
| + | * [http://scripts.iucr.org/cgi-bin/paper?ad0105 Synchrotron X-ray reciprocal-space mapping, topography and diffraction resolution studies of macromolecular crystal quality] T. J. Boggon, J. R. Helliwell, R. A. Judge, A. Olczak, D. P. Siddons, E. H. Snell and V. Stojanoff ''Acta Cryst.'' '''2000''', D56, 868-880. [http://dx.doi.org/10.1107/S0907444900005837 doi: 10.1107/S0907444900005837] | ||
* [http://scitation.aip.org/content/aip/journal/apl/80/21/10.1063/1.1481786 Strain and composition distributions in wurtzite InGaN/GaN layers extracted from x-ray reciprocal space mapping] S. Pereira, M. R. Correia, E. Pereira, K. P. O’Donnell, E. Alves, A. D. Sequeira, N. Franco, I. M. Watson and C. J. Deatcher ''Appl. Phys. Lett.'' '''2002''', 80, 3913. [http://dx.doi.org/10.1063/1.1481786 doi: 10.1063/1.1481786] | * [http://scitation.aip.org/content/aip/journal/apl/80/21/10.1063/1.1481786 Strain and composition distributions in wurtzite InGaN/GaN layers extracted from x-ray reciprocal space mapping] S. Pereira, M. R. Correia, E. Pereira, K. P. O’Donnell, E. Alves, A. D. Sequeira, N. Franco, I. M. Watson and C. J. Deatcher ''Appl. Phys. Lett.'' '''2002''', 80, 3913. [http://dx.doi.org/10.1063/1.1481786 doi: 10.1063/1.1481786] | ||
* [http://scripts.iucr.org/cgi-bin/paper?S0909049505030815 Reciprocal space mapping and single-crystal scattering rods] D.-M. Smilgies, D. R. Blasini, S. Hotta and H. Yanagi ''J. Synchrotron Rad.'' '''2005''', 12, 807-811. [http://dx.doi.org/10.1107/S0909049505030815 doi: 10.1107/S0909049505030815] | * [http://scripts.iucr.org/cgi-bin/paper?S0909049505030815 Reciprocal space mapping and single-crystal scattering rods] D.-M. Smilgies, D. R. Blasini, S. Hotta and H. Yanagi ''J. Synchrotron Rad.'' '''2005''', 12, 807-811. [http://dx.doi.org/10.1107/S0909049505030815 doi: 10.1107/S0909049505030815] | ||
* [http://scitation.aip.org/content/aip/journal/apl/90/18/10.1063/1.2736193 X-ray diffraction reciprocal space mapping study of the thin film phase of pentacene] Hiroyuki Yoshida, Katsuhiko Inaba and Naoki Sato ''Appl. Phys. Lett.'' '''2007''', 90, 181930. [http://dx.doi.org/10.1063/1.2736193 doi: 10.1063/1.2736193] | * [http://scitation.aip.org/content/aip/journal/apl/90/18/10.1063/1.2736193 X-ray diffraction reciprocal space mapping study of the thin film phase of pentacene] Hiroyuki Yoshida, Katsuhiko Inaba and Naoki Sato ''Appl. Phys. Lett.'' '''2007''', 90, 181930. [http://dx.doi.org/10.1063/1.2736193 doi: 10.1063/1.2736193] | ||
Revision as of 16:36, 12 January 2015
Reciprocal-space mapping (RSM) refers to a suite of scattering methods wherein the three-dimensional reciprocal-space of the sample is reconstructed by iteratively measuring a variety of two-dimensional 'slices' through the space. A given x-ray scattering experiment probes a 2D plane through reciprocal-space (actually a curved surface, known as the Ewald sphere). By reorienting the sample, multiple 'slices' through reciprocal-space can be obtained. These slices can then be combined to yield the full, 3D reciprocal-space.
See Also
- CD-SAXS and RSANS
- Pole figure
- Synchrotron X-ray reciprocal-space mapping, topography and diffraction resolution studies of macromolecular crystal quality T. J. Boggon, J. R. Helliwell, R. A. Judge, A. Olczak, D. P. Siddons, E. H. Snell and V. Stojanoff Acta Cryst. 2000, D56, 868-880. doi: 10.1107/S0907444900005837
- Strain and composition distributions in wurtzite InGaN/GaN layers extracted from x-ray reciprocal space mapping S. Pereira, M. R. Correia, E. Pereira, K. P. O’Donnell, E. Alves, A. D. Sequeira, N. Franco, I. M. Watson and C. J. Deatcher Appl. Phys. Lett. 2002, 80, 3913. doi: 10.1063/1.1481786
- Reciprocal space mapping and single-crystal scattering rods D.-M. Smilgies, D. R. Blasini, S. Hotta and H. Yanagi J. Synchrotron Rad. 2005, 12, 807-811. doi: 10.1107/S0909049505030815
- X-ray diffraction reciprocal space mapping study of the thin film phase of pentacene Hiroyuki Yoshida, Katsuhiko Inaba and Naoki Sato Appl. Phys. Lett. 2007, 90, 181930. doi: 10.1063/1.2736193
