Difference between revisions of "Peak shape"

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Revision as of 11:41, 4 September 2014

Peak.png

The peak width observed in x-ray scattering can be related to the grain size of the ordered structure giving rise to the scattering peak. More generally, the peak shape also encodes information about the sample order. Thus, peak shape analysis can be used to extract higher-order information.

Note also that instrumental resolution contributes to peak width, and also to peak shape. Scattering peaks are thus sometimes fit using functions that include two contributes (e.g. a Gaussian, representing material grain size, plus a Lorentzian, representing instrumental resolution).

Literature Examples

TBD

See Also