Difference between revisions of "Kikuchi patterns"
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| − | Sharp intersecting lines are sometimes observed in [[scattering]] data for single-crystal materials (e.g. if one's sample is supported on a [[Material:Silicon|silicon]] substrate). In electron microscopy, these | + | Sharp intersecting lines are sometimes observed in [[scattering]] data for single-crystal materials (e.g. if one's sample is supported on a [[Material:Silicon|silicon]] substrate). In electron microscopy, multiple-scattering events create these '''Kikuchi patterns''', while in x-ray scattering they may be called '''Kossel lines'''. |
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Revision as of 17:14, 13 October 2015
Sharp intersecting lines are sometimes observed in scattering data for single-crystal materials (e.g. if one's sample is supported on a silicon substrate). In electron microscopy, multiple-scattering events create these Kikuchi patterns, while in x-ray scattering they may be called Kossel lines.
See Also
- W. G. Morris Crystal orientation and lattice parameters from Kossel lines J. Appl. Phys. 1968, 39, 1813–1823. doi: 10.1063/1.1656436
- G. Nolze, C. Grosse and A. Winkelmann Kikuchi pattern analysis of noncentrosymmetric crystals J. Appl. Cryst. 2015, 48. doi: 10.1107/S1600576715014016
