Difference between revisions of "XCCA"

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'''X-ray cross-correlation analysis''' ('''XCCA''') is a suite of techniques for analyzing correlations within [[x-ray]] [[scattering]] datasets. In particular, analysis of angular correlations within the 2D detector image can be used to isolate structural information that would be lost in a conventional circular-averaged 1D curve. Thus, even for nominally isotropic materials (powder-like sample), information about local symmetry (and thus packing motifs or [[unit cell]]) can be extracted from the data.
 
'''X-ray cross-correlation analysis''' ('''XCCA''') is a suite of techniques for analyzing correlations within [[x-ray]] [[scattering]] datasets. In particular, analysis of angular correlations within the 2D detector image can be used to isolate structural information that would be lost in a conventional circular-averaged 1D curve. Thus, even for nominally isotropic materials (powder-like sample), information about local symmetry (and thus packing motifs or [[unit cell]]) can be extracted from the data.
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==References==
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* Lehmkühler, F.; Fischer, B.; Müller, L.; Ruta B.; Grübel, G. [http://scripts.iucr.org/cgi-bin/paper?zg5001 Structure beyond pair correlations: X-ray cross-correlation from colloidal crystals] ''Journal of Applied Crystallography'' '''2016''', 49, [https://doi.org/10.1107/S1600576716017313 doi: 10.1107/S1600576716017313]
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==See Also==
 
==See Also==
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* [[Fluctuation X-ray Scattering]] (FXS)
 
* [[Variance Scattering]] (VS)
 
* [[Variance Scattering]] (VS)
 
** [[Ring graininess]] analysis (to determine grain count, grain size and size-distribution, crystallinity, etc.)
 
** [[Ring graininess]] analysis (to determine grain count, grain size and size-distribution, crystallinity, etc.)
 
*** [[Yager, K.G.]]; Majewski, P.W. [http://scripts.iucr.org/cgi-bin/paper?S1600576714020822 Metrics of graininess: robust quantification of grain count from the non-uniformity of scattering rings] ''Journal of Applied Crystallography'' '''2014''', 47, 1855–1865. [http://dx.doi.org/10.1107/S1600576714020822 doi: 10.1107/S1600576714020822]
 
*** [[Yager, K.G.]]; Majewski, P.W. [http://scripts.iucr.org/cgi-bin/paper?S1600576714020822 Metrics of graininess: robust quantification of grain count from the non-uniformity of scattering rings] ''Journal of Applied Crystallography'' '''2014''', 47, 1855–1865. [http://dx.doi.org/10.1107/S1600576714020822 doi: 10.1107/S1600576714020822]
* XCCA
 
** Lehmkühler, F.; Fischer, B.; Müller, L.; Ruta B.; Grübel, G. [http://scripts.iucr.org/cgi-bin/paper?zg5001 Structure beyond pair correlations: X-ray cross-correlation from colloidal crystals] ''Journal of Applied Crystallography'' '''2016''', 49, [https://doi.org/10.1107/S1600576716017313 doi: 10.1107/S1600576716017313]
 

Revision as of 15:23, 11 November 2016

X-ray cross-correlation analysis (XCCA) is a suite of techniques for analyzing correlations within x-ray scattering datasets. In particular, analysis of angular correlations within the 2D detector image can be used to isolate structural information that would be lost in a conventional circular-averaged 1D curve. Thus, even for nominally isotropic materials (powder-like sample), information about local symmetry (and thus packing motifs or unit cell) can be extracted from the data.

References


See Also