XPCS

X-ray Photon Correlation Spectroscopy (XPCS) is a technique that exploits a coherent x-ray synchrotron beam to measure the dynamics of a sample. By recording how coherent speckle fluctuations in time, one can measure a time correlation function, and thus measure the timescale processes of interest (diffusion, relaxation, reorganization, etc.).

See Also

• Correlation methods

Reviews

• XPCS slides by Anders Madsen.
• P.-A. Lemieux, D.J. Durian Investigating non-Gaussian scattering processes by using nth-order intensity correlation functions Journal of the Optical Society of America 1999, 16(7), 1651-1664. doi: 10.1364/JOSAA.16.001651
• Robert L. Leheny XPCS: Nanoscale motion and rheology Current Opinion in Colloid & Interface Science 2012, 17 (1), 3–12. doi: 10.1016/j.cocis.2011.11.002
• Oleg G. Shpyrko X-ray photon correlation spectroscopy J. Synchrotron Radiation 2014, 21 (5), 1057-1064. doi: 10.1107/S1600577514018232
• Sunil K. Sinha, Zhang Jiang, Laurence B. Lurio -ray Photon Correlation Spectroscopy Studies of Surfaces and Thin Films Advanced Materials 2014, 26 (46), 7764–7785. doi: 10.1002/adma.201401094
• Aurora Nogales, Andrei Fluerasu X Ray Photon Correlation Spectroscopy for the study of polymer dynamics European Polymer Journal 2016. doi: 10.1016/j.eurpolymj.2016.03.032

Data Analysis

• R. N. Andrews, S. Narayanan, F. Zhang, I. Kuzmenko and J. Ilavsky Inverse transformation: unleashing spatially heterogeneous dynamics with an alternative approach to XPCS data analysis J. Appl. Cryst. 2018, 51 doi: 10.1107/S1600576717015795
• R. N. Andrews, S. Narayanan, F. Zhang, I. Kuzmenko and J. Ilavsky CONTIN XPCS: software for inverse transform analysis of X-ray photon correlation spectroscopy dynamics J. Appl. Cryst. 2018, 51 doi: 10.1107/S1600576717017113