XCCA

X-ray cross-correlation analysis (XCCA) is a suite of techniques for analyzing correlations within x-ray scattering datasets. In particular, analysis of angular correlations within the 2D detector image can be used to isolate structural information that would be lost in a conventional circular-averaged 1D curve. Thus, even for nominally isotropic materials (powder-like sample), information about local symmetry (and thus packing motifs or unit cell) can be extracted from the data.

References

• Lehmkühler, F.; Fischer, B.; Müller, L.; Ruta B.; Grübel, G. Structure beyond pair correlations: X-ray cross-correlation from colloidal crystals Journal of Applied Crystallography 2016, 49, doi: 10.1107/S1600576716017313

See Also

• X-ray Photon Correlation Spectroscopy (XPCS)
• Fluctuation X-ray Scattering (FXS)
• Variance Scattering (VS)
  • Ring graininess analysis (to determine grain count, grain size and size-distribution, crystallinity, etc.)
    • Yager, K.G.; Majewski, P.W. Metrics of graininess: robust quantification of grain count from the non-uniformity of scattering rings Journal of Applied Crystallography 2014, 47, 1855–1865. doi: 10.1107/S1600576714020822