Peak shape

The peak width observed in x-ray scattering can be related to the grain size of the ordered structure giving rise to the scattering peak. More generally, the peak shape also encodes information about the sample order. Thus, peak shape analysis can be used to extract higher-order information.

Note also that instrumental resolution contributes to peak width, and also to peak shape. Scattering peaks are thus sometimes fit using functions that include two contributes (e.g. a Gaussian, representing material grain size, plus a Lorentzian, representing instrumental resolution).

Literature Examples

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See Also

• Scherrer grain size analysis: Converting the peak width into a measure of the structural coherence length (grain size)