Kikuchi patterns
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Sharp intersecting lines are sometimes observed in scattering data for single-crystal materials (e.g. if one's sample is supported on a silicon substrate). In electron microscopy, these are called Kikuchi patterns, while in x-ray scattering there may be called Kossel lines.
These arise from the intersection of the detector plane (Ewald sphere) with the reciprocal-space scattering.
See Also
- W. G. Morris Crystal orientation and lattice parameters from Kossel lines J. Appl. Phys. 1968, 39, 1813–1823. doi: 10.1063/1.1656436
- G. Nolze, C. Grosse and A. Winkelmann Kikuchi pattern analysis of noncentrosymmetric crystals J. Appl. Cryst. 2015, 48. doi: 10.1107/S1600576715014016
