Difference between revisions of "Reciprocal-space mapping"
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| − | Reciprocal-space mapping (RSM) refers to a suite of [[scattering]] methods wherein the three-dimensional [[reciprocal-space]] of the sample is reconstructed by iteratively measuring a variety of two-dimensional 'slices' through the space. A given [[x-ray]] scattering experiment probes a 2D plane through reciprocal-space (actually a curved surface, known as the [[Ewald sphere]]). By [[sample orientation|reorienting]] the sample, multiple 'slices' through reciprocal-space can be obtained. These slices can then be combined to yield the full, 3D reciprocal-space. | + | '''Reciprocal-space mapping''' ('''RSM''') refers to a suite of [[scattering]] methods wherein the three-dimensional [[reciprocal-space]] of the sample is reconstructed by iteratively measuring a variety of two-dimensional 'slices' through the space. A given [[x-ray]] scattering experiment probes a 2D plane through reciprocal-space (actually a curved surface, known as the [[Ewald sphere]]). By [[sample orientation|reorienting]] the sample, multiple 'slices' through reciprocal-space can be obtained. These slices can then be combined to yield the full, 3D reciprocal-space. |
==See Also== | ==See Also== | ||
Revision as of 17:34, 12 January 2015
Reciprocal-space mapping (RSM) refers to a suite of scattering methods wherein the three-dimensional reciprocal-space of the sample is reconstructed by iteratively measuring a variety of two-dimensional 'slices' through the space. A given x-ray scattering experiment probes a 2D plane through reciprocal-space (actually a curved surface, known as the Ewald sphere). By reorienting the sample, multiple 'slices' through reciprocal-space can be obtained. These slices can then be combined to yield the full, 3D reciprocal-space.
See Also
- CD-SAXS and RSANS
- Strain and composition distributions in wurtzite InGaN/GaN layers extracted from x-ray reciprocal space mapping S. Pereira, M. R. Correia, E. Pereira, K. P. O’Donnell, E. Alves, A. D. Sequeira, N. Franco, I. M. Watson and C. J. Deatcher Appl. Phys. Lett. 2002, 80, 3913. doi: 10.1063/1.1481786
- Reciprocal space mapping and single-crystal scattering rods D.-M. Smilgies, D. R. Blasini, S. Hotta and H. Yanagi J. Synchrotron Rad. 2005, 12, 807-811. doi: 10.1107/S0909049505030815
- X-ray diffraction reciprocal space mapping study of the thin film phase of pentacene Hiroyuki Yoshida, Katsuhiko Inaba and Naoki Sato Appl. Phys. Lett. 2007, 90, 181930. doi: 10.1063/1.2736193
