X-ray reflectivity experiments can be performed near the resonant absorption edge of one of the elements in the multi-layer stack, thereby highlighting the contribution of this species/layer. More generally, multiple reflectivity experiments at different x-ray energies can be used to disambiguated the distribution of different elements.
- M. Nayak, P. C. Pradhan and G. S. Lodha Element-specific structural analysis of Si/B4C using resonant X-ray reflectivity J. Appl. Cryst. 2015, 48. doi: 10.1107/S1600576715005877