Difference between revisions of "XPCS"

From GISAXS
Jump to: navigation, search
(See Also)
(Reviews)
 
Line 10: Line 10:
 
* Sunil K. Sinha, Zhang Jiang, Laurence B. Lurio [http://onlinelibrary.wiley.com/doi/10.1002/adma.201401094/abstract -ray Photon Correlation Spectroscopy Studies of Surfaces and Thin Films] ''Advanced Materials'' '''2014''', 26 (46), 7764–7785. [http://dx.doi.org/10.1002/adma.201401094 doi: 10.1002/adma.201401094]
 
* Sunil K. Sinha, Zhang Jiang, Laurence B. Lurio [http://onlinelibrary.wiley.com/doi/10.1002/adma.201401094/abstract -ray Photon Correlation Spectroscopy Studies of Surfaces and Thin Films] ''Advanced Materials'' '''2014''', 26 (46), 7764–7785. [http://dx.doi.org/10.1002/adma.201401094 doi: 10.1002/adma.201401094]
 
* Aurora Nogales, Andrei Fluerasu [http://www.sciencedirect.com/science/article/pii/S001430571630146X X Ray Photon Correlation Spectroscopy for the study of polymer dynamics] ''European Polymer Journal'' '''2016'''. [http://dx.doi.org/10.1016/j.eurpolymj.2016.03.032 doi: 10.1016/j.eurpolymj.2016.03.032]
 
* Aurora Nogales, Andrei Fluerasu [http://www.sciencedirect.com/science/article/pii/S001430571630146X X Ray Photon Correlation Spectroscopy for the study of polymer dynamics] ''European Polymer Journal'' '''2016'''. [http://dx.doi.org/10.1016/j.eurpolymj.2016.03.032 doi: 10.1016/j.eurpolymj.2016.03.032]
 +
* Alec R. Sandy, Qingteng Zhang, Laurence B. Lurio [https://www.annualreviews.org/doi/full/10.1146/annurev-matsci-070317-124334 Hard X-ray Photon Correlation Spectroscopy Studies for Materials Studies] ''Annual Reviews'' '''2018''', 48, 167-190. [https://doi.org/10.1146/annurev-matsci-070317-124334 doi: 10.1146/annurev-matsci-070317-124334]
 +
 
===Data Analysis===
 
===Data Analysis===
 
* R. N. Andrews, S. Narayanan, F. Zhang, I. Kuzmenko and J. Ilavsky [http://scripts.iucr.org/cgi-bin/paper?te5020 Inverse transformation: unleashing spatially heterogeneous dynamics with an alternative approach to XPCS data analysis] ''J. Appl. Cryst.'' '''2018''', 51 [https://doi.org/10.1107/S1600576717015795 doi: 10.1107/S1600576717015795]
 
* R. N. Andrews, S. Narayanan, F. Zhang, I. Kuzmenko and J. Ilavsky [http://scripts.iucr.org/cgi-bin/paper?te5020 Inverse transformation: unleashing spatially heterogeneous dynamics with an alternative approach to XPCS data analysis] ''J. Appl. Cryst.'' '''2018''', 51 [https://doi.org/10.1107/S1600576717015795 doi: 10.1107/S1600576717015795]
 
* R. N. Andrews, S. Narayanan, F. Zhang, I. Kuzmenko and J. Ilavsky [http://scripts.iucr.org/cgi-bin/paper?te5027 CONTIN XPCS: software for inverse transform analysis of X-ray photon correlation spectroscopy dynamics] ''J. Appl. Cryst.'' '''2018''', 51 [https://doi.org/10.1107/S1600576717017113 doi: 10.1107/S1600576717017113]
 
* R. N. Andrews, S. Narayanan, F. Zhang, I. Kuzmenko and J. Ilavsky [http://scripts.iucr.org/cgi-bin/paper?te5027 CONTIN XPCS: software for inverse transform analysis of X-ray photon correlation spectroscopy dynamics] ''J. Appl. Cryst.'' '''2018''', 51 [https://doi.org/10.1107/S1600576717017113 doi: 10.1107/S1600576717017113]

Latest revision as of 13:57, 22 April 2020

X-ray Photon Correlation Spectroscopy (XPCS) is a technique that exploits a coherent x-ray synchrotron beam to measure the dynamics of a sample. By recording how coherent speckle fluctuations in time, one can measure a time correlation function, and thus measure the timescale processes of interest (diffusion, relaxation, reorganization, etc.).

See Also

Reviews

Data Analysis