Silicon dioxide (SiO2), also known as silica, spontaneously forms on the surface of a silicon wafer exposed to air. This 'native oxide' must be included in calculations of (for example) the x-ray reflectivity curve for a Si surface. In terms of x-ray properties, SiO2 can be used to approximate a variety of related materials (fused quartz, glass, etc.).
- Density: 2.648 g/cm3
- Neutron SLD: 4.183×10−6 Å−2
|Material||density (g/cm3)||X-ray energy (keV)||X-ray wavelength (Å)||critical angle (°)||qc (Å−1)||SLD (10−6Å−2)|