Difference between revisions of "Software"

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(Reflectivity)
(Reflectivity)
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===Reflectivity===
 
===Reflectivity===
* [[Motofit]]: Written by Andrew Nelson, ANSTO, Australia.
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* '''Reflfit''': NIST software for fitting neutron (or x-ray) reflectivity curves.
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** [http://www.ncnr.nist.gov/programs/reflect/data_reduction/software/ Official page.]
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* '''Motofit''': Co-refinement of multiple contrast reflectometry data (x-ray or neutron). Written by Andrew Nelson, ANSTO, Australia.
 
** Reference: Nelson, A. [http://www.iucr.org/cgi-bin/paper?ce5001 "Co-refinement of multiple contrast neutron / X-ray reflectivity data using MOTOFIT."] ''Journal of Applied Crystallography'' 2006, 39, 273-276. [http://dx.doi.org/10.1107/S0021889806005073 doi: 10.1107/S0021889806005073]
 
** Reference: Nelson, A. [http://www.iucr.org/cgi-bin/paper?ce5001 "Co-refinement of multiple contrast neutron / X-ray reflectivity data using MOTOFIT."] ''Journal of Applied Crystallography'' 2006, 39, 273-276. [http://dx.doi.org/10.1107/S0021889806005073 doi: 10.1107/S0021889806005073]
 
** '''[http://motofit.sourceforge.net/ Official Page.]'''  
 
** '''[http://motofit.sourceforge.net/ Official Page.]'''  
* [[Yanera]]: "Yet Another NEutron Reflectivity Analyzer", provides an open-source C++ implementation of the [[Parratt formalism]]. Written by [[Thad Harroun]] (Brock University), with contributions from [[Kevin Yager]].
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* '''Yanera''': "Yet Another NEutron Reflectivity Analyzer", provides an open-source C++ implementation of the [[Parratt formalism]]. Written by [[Thad Harroun]] (Brock University), with contributions from [[Kevin Yager]].
 
** [http://www.physics.brocku.ca/~tharroun/yanera/index.html Official page.]
 
** [http://www.physics.brocku.ca/~tharroun/yanera/index.html Official page.]
* Parratt32
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* '''GA refl''': Simultaneous fitting of x-ray and neutron polarized reflectometry data.
* drydoc
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** [http://www.ncnr.nist.gov/programs/reflect/data_reduction/software/garefl.html Official page.]
* reflfit
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* '''Simulreflec''': Calculate reflectivity of magnetic multiplayer systems.
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** [http://www-llb.cea.fr/prism/programs/simulreflec/simulreflec.html Official page.]
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* '''AFIT''': Fitting of reflectometry data. ([http://physchem.ox.ac.uk/%7erkt/AFit.zip download])
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* '''Parratt32''': Windows GUI implementing the Parratt formalism. ([http://www.hmi.de/bensc/instrumentation/instrumente/v6/refl/parratt_en.htm link])
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* '''Drydoc and Wetdoc''': Multiple contrast data fitting. ([http://www.studsvik.uu.se/research/NR/drydoc.htm link])
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* '''Surface''': Analysis of specular reflectivity. ([http://www.isis.rl.ac.uk/largescale/SURF/technical/surface.htm link])
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* '''Polly''': Polarized neutron reflectometry. ([http://www.isis.rl.ac.uk/largescale/CRISP/downloads/POLLY/reg_form.htm link])
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* '''Superfit''': Specular and diffuse neutron reflectivity. ([http://www.mf.mpg.de/en/abteilungen/dosch/software/software_en.shtml link])

Revision as of 09:45, 3 June 2014

A common question for new GISAXS users is: "What software can I use to analyze my data?" Unfortunately, there is no single package that will allow you to perform any possible analysis. This is in part due to the diversity of possible kinds of data analysis one might want to do on GISAXS or GIWAXS images. The following lists a variety of packages that are available.

Data Viewing, Reduction, and Simple Analysis

These packages provide ways to view data, and perform simple operations (linecuts, etc.).

  • Fit2D: A well-known package for treatment and conversion 2D scattering images.
  • ImageJ: A generic tool for image treatment and analysis. Can be used to open and process x-ray detector images.
  • view.gtk: A simple interface for viewing 2D data, calibrating your data into q-space, and extracting linecuts. Written by Lin Yang for the X9 beamline at NSLS.
    • [Download here.] Installation requires GTK libraries.
  • DPDAK: Open-source Python tool for analyzing large sets of SAXS data. Wrosk on Linux and Windows.

Data Modeling and Fitting

SAXS

  • Scatter: Targetted towards analysis of transmission-mode SAXS and SANS. Allows modeling of nano- and meso-structrue materials (surfactants, lipids, micelles, vesicles, block-copolymers, etc.).

GISAXS

Reflectivity