Difference between revisions of "Example:P3HT orientation analysis"

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(Created page with " ==Caveats== * '''Standing-up''': The preceeding analysis has assumed that the 100 scattering along ''q<sub>r</sub>'' arises from ''face-on'' material. However, both ''face-on...")
 
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==Caveats==
 
==Caveats==
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==Literature==
 
==Literature==
===Related papers===
 
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====Angular correction===
 
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====sin(angle) correction====
 
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===Development/description of analysis method===
 
===Development/description of analysis method===
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===Application of method===
 
===Application of method===
 
* [http://pubs.acs.org/doi/abs/10.1021/cm501251n Stable and Controllable Polymer/Fullerene Composite Nanofibers through Cooperative Noncovalent Interactions for Organic Photovoltaics] Fei Li, [[Kevin G. Yager]], Noel M. Dawson, Ying-Bing Jiang, Kevin J. Malloy, and Yang Qin ''Chemistry of Materials'' 2014 [http://dx.doi.org/10.1021/cm501251n doi: 10.1021/cm501251n]
 
* [http://pubs.acs.org/doi/abs/10.1021/cm501251n Stable and Controllable Polymer/Fullerene Composite Nanofibers through Cooperative Noncovalent Interactions for Organic Photovoltaics] Fei Li, [[Kevin G. Yager]], Noel M. Dawson, Ying-Bing Jiang, Kevin J. Malloy, and Yang Qin ''Chemistry of Materials'' 2014 [http://dx.doi.org/10.1021/cm501251n doi: 10.1021/cm501251n]
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===Related papers===
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====Angular correction (curvature of [[Ewald sphere]])====
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* '''[http://pubs.acs.org/doi/abs/10.1021/la904840q Quantification of Thin Film Crystallographic Orientation Using X-ray Diffraction with an Area Detector]''' Jessy L. Baker, Leslie H. Jimison, Stefan Mannsfeld, Steven Volkman, Shong Yin, Vivek Subramanian, Alberto Salleo, A. Paul Alivisatos and Michael F. Toney ''Langmuir'' 2010, 26 (11), 9146-9151. [http://dx.doi.org/10.1021/la904840q doi: 10.1021/la904840q]
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* [http://scripts.iucr.org/cgi-bin/paper?S0021889808001064 Simulating X-ray diffraction of textured films] D. W. Breiby, O. Bunk, J. W. Andreasen, H. T. Lemke and M. M. Nielsen ''J. Appl. Cryst.'' 2008, 41, 262-271. [http://dx.doi.org/10.1107/S0021889808001064 doi: 10.1107/S0021889808001064]
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====sin(angle) correction====
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* [http://pubs.acs.org/doi/abs/10.1021/nl501233g Confinement-Driven Increase in Ionomer Thin-Film Modulus] Kirt A. Page, Ahmet Kusoglu, Christopher M. Stafford, Sangcheol Kim, R. Joseph Kline, and Adam Z. Weber ''Nano Letters'' 2014, 14 (5), 2299-2304. [http://dx.doi.org/10.1021/nl501233g doi: 10.1021/nl501233g]
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====Other orientation analyses====
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* [http://scripts.iucr.org/cgi-bin/paper?S0021889806038957 Evaluation of equatorial orientation distributions] C. Burger and W. Ruland ''J. Appl. Cryst.'' 2006, 39, 889-891. [http://dx.doi.org/10.1107/S0021889806038957 doi: 10.1107/S0021889806038957]
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* [http://scripts.iucr.org/cgi-bin/paper?S0021889807010503 Two-dimensional small-angle X-ray scattering of self-assembled nanocomposite films with oriented arrays of spheres: determination of lattice type, preferred orientation, deformation and imperfection] W. Ruland and B. M. Smarsly ''J. Appl. Cryst.'' 2007, 40, 409-417. [http://dx.doi.org/10.1107/S0021889807010503 doi: 10.1107/S0021889807010503]
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* [http://pubs.acs.org/doi/abs/10.1021/nl903187v Device-Scale Perpendicular Alignment of Colloidal Nanorods] Jessy L. Baker, Asaph Widmer-Cooper, Michael F. Toney, Phillip L. Geissler and A. Paul Alivisatos ''Nano Letters'' 2010, 10 (1), 195-201. [http://dx.doi.org/10.1021/nl903187v doi: 10.1021/nl903187v]

Revision as of 13:24, 18 June 2014

TBD

Caveats

  • Standing-up: The preceeding analysis has assumed that the 100 scattering along qr arises from face-on material. However, both face-on and end-on material would give rise to scattering at that position in reciprocal-space. To differentiate between those two possibilities, one must invoke additional data. Specifically, one can look at the 010 (π-π) peak: for end-on, the π-π peak will also be in-plane (along qr), whereas for face-on, one should observe substantial intensity of the π-π peak in the out-of-plane direction (near qz axis).

Literature

Development/description of analysis method

Application of method

Related papers

Angular correction (curvature of Ewald sphere)

sin(angle) correction

Other orientation analyses