Difference between revisions of "X9"

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(Performance)
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* '''1.5 m''': 0.011 Å<sup>−1</sup> to 0.45 Å<sup>−1</sup> (63 nm to 1.4 nm)
 
* '''1.5 m''': 0.011 Å<sup>−1</sup> to 0.45 Å<sup>−1</sup> (63 nm to 1.4 nm)
  
For WAXS, the standard configuration yields approximately (for 13.5 keV):
+
For WAXS, standard configurations yields approximately (for 13.5 keV):
 
* '''0.235 m''' (sample inside chamber): 0.13 Å<sup>−1</sup> to 4.1 Å<sup>−1</sup> (4.8 nm to 0.15 nm)
 
* '''0.235 m''' (sample inside chamber): 0.13 Å<sup>−1</sup> to 4.1 Å<sup>−1</sup> (4.8 nm to 0.15 nm)
 
* '''~0.4 m''' (sample upstream of chamber): 0.15 Å<sup>−1</sup> to 2.1 Å<sup>−1</sup> (4.2 nm to 0.3 nm)
 
* '''~0.4 m''' (sample upstream of chamber): 0.15 Å<sup>−1</sup> to 2.1 Å<sup>−1</sup> (4.2 nm to 0.3 nm)
 +
 +
 +
===Flux===
 +
* At 10 keV, flux capture by mirrors is ~2×10<sup>12</sup> ph/s/0.01%bw
 +
* At 10 keV, flux at sample is ~5×10<sup>11</sup> ph/s/0.01%bw
 +
* At 10 keV, microfocused (10 um), flux at sample is ~2×10<sup>11</sup> ph/s/0.01%bw
  
 
==Safety==
 
==Safety==
 
Users must complete [http://www.bnl.gov/ps/nsls/users/access/training.asp NSLS safety training], as well as receive beamline-specific training:
 
Users must complete [http://www.bnl.gov/ps/nsls/users/access/training.asp NSLS safety training], as well as receive beamline-specific training:
 
* [http://beamlines.ps.bnl.gov/forms/BLOSA/X9.pdf X9 BLOSA form]
 
* [http://beamlines.ps.bnl.gov/forms/BLOSA/X9.pdf X9 BLOSA form]

Revision as of 16:57, 3 June 2014

X9 is an x-ray synchrotron beamline at the National Synchrotron Light Source (NSLS), Brookhaven National Lab (BNL). It is a joint beamline between the NSLS and the Center for Functional Nanomaterials. The instrument is optimized for doing Small-Angle X-ray Scattering (SAXS) and Grazing-Incidence Small-Angle X-ray Scattering (GISAXS), as well as wide-angle Grazing-Incidence X-ray Diffraction (GID/GIXD/GIWAXS).

X9 NSLS 01.jpgX9 NSLS 02.jpg

Capabilities

TBD

Performance

Energy range

Can perform experiments from 6 keV to 20 keV.

q-range

The instrument can capture data on both a SAXS and WAXS detector (either simultaneously or sequentially). The q-range depends on x-ray energy and the sample-detector distance. For SAXS, one can typically obtain (e.g. for 13.5 keV):

  • 5.4 m: 0.002 Å−1 to 0.1 Å−1 (314 nm to 6.3 nm)
  • 4.1 m: 0.005 Å−1 to 0.2 Å−1 (125 nm to 3.5 nm)
  • 3.0 m: 0.004 Å−1 to 0.2 Å−1 (157 nm to 3.5 nm)
  • 2.0 m: 0.010 Å−1 to 0.4 Å−1 (63 nm to 1.6 nm)
  • 1.5 m: 0.011 Å−1 to 0.45 Å−1 (63 nm to 1.4 nm)

For WAXS, standard configurations yields approximately (for 13.5 keV):

  • 0.235 m (sample inside chamber): 0.13 Å−1 to 4.1 Å−1 (4.8 nm to 0.15 nm)
  • ~0.4 m (sample upstream of chamber): 0.15 Å−1 to 2.1 Å−1 (4.2 nm to 0.3 nm)


Flux

  • At 10 keV, flux capture by mirrors is ~2×1012 ph/s/0.01%bw
  • At 10 keV, flux at sample is ~5×1011 ph/s/0.01%bw
  • At 10 keV, microfocused (10 um), flux at sample is ~2×1011 ph/s/0.01%bw

Safety

Users must complete NSLS safety training, as well as receive beamline-specific training: