Difference between revisions of "Refraction distortion"
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==Mathematics== | ==Mathematics== | ||
The GISAXS refraction distortion shifts the data along <math>\scriptstyle q_z</math>, leaving <math>\scriptstyle q_x</math> unaffected. The amount of the shift is given by: | The GISAXS refraction distortion shifts the data along <math>\scriptstyle q_z</math>, leaving <math>\scriptstyle q_x</math> unaffected. The amount of the shift is given by: | ||
+ | :<math> | ||
+ | \begin{alignat}{2} | ||
+ | \Delta q_z & = q_z - q_z^{\prime} \\ | ||
+ | q'_z & = k_0\left(\sqrt{\sin\alpha_i^2 - \sin\alpha_{ct}^2} + \sqrt{\sin\alpha_f^2 - \sin\alpha_{ct}^2}\right) \\ | ||
+ | & = k_0\left(\sqrt{\sin\alpha_i^2 - \sin\alpha_{ct}^2} + \sqrt{\left(\frac{q_z}{k_0} - \sin\alpha_i\right)^2 - \sin\alpha_{ct}^2}\right) | ||
− | [[Image:Lu GTSAXS-Figure5.png|center|thumb| | + | \end{alignat} |
+ | </math> | ||
+ | Where <math>\scriptstyle \alpha_i</math> is the incident angle, and <math>\scriptstyle \alpha_{ct}</math> is the [[critical angle]] of the film. | ||
+ | |||
+ | [[Image:Lu GTSAXS-Figure5.png|center|thumb|450px|Figure from Lu. et al. ([http://dx.doi.org/10.1107/S0021889812047887 doi: 10.1107/S0021889812047887 ''J. of Appl. Cryst.'' '''2013''', 46, 165]) showing the amount of distortion along ''q<sub>z</sub>'', for different conditions.]] | ||
==Refraction Correction== | ==Refraction Correction== |
Revision as of 13:24, 4 November 2015
In GISAXS, GIWAXS, and other grazing-incidence techniques, the refractive index difference between the film and the ambient causes the incident and scattered x-ray beams to be refracted. This extent of refraction depends on the incident and exit angles. Thus, the data that appears on an area detector in a grazing-incidence experiment is non-linearly distorted. This makes data interpretation more problematic.
Mathematics
The GISAXS refraction distortion shifts the data along , leaving unaffected. The amount of the shift is given by:
Where is the incident angle, and is the critical angle of the film.
Refraction Correction
When computing theoretical scattering patterns, one must account for the refraction correction.
- Byeongdu Lee, Insun Park, Jinhwan Yoon, Soojin Park, Jehan Kim, Kwang-Woo Kim, Taihyun Chang, and Moonhor Ree Structural Analysis of Block Copolymer Thin Films with Grazing Incidence Small-Angle X-ray Scattering Macromolecules 2005, 38 (10), 4311-4323. doi: 10.1021/ma047562d
- P. Busch, M. Rauscher, D.-M. Smilgies, D. Posselt and C. M. Papadakis Grazing-incidence small-angle X-ray scattering from thin polymer films with lamellar structures - the scattering cross section in the distorted-wave Born approximation J. Appl. Cryst. 2006, 39, 433-442. doi: 10.1107/S0021889806012337
- Rémi Lazzari, Frédéric Leroy, and Gilles Renaud Grazing-incidence small-angle x-ray scattering from dense packing of islands on surfaces: Development of distorted wave Born approximation and correlation between particle sizes and spacing Phys. Rev. B 2007, 76, 125411. doi: 10.1103/PhysRevB.76.125411
- D. W. Breiby, O. Bunk, J. W. Andreasen, H. T. Lemke and M. M. Nielsen Simulating X-ray diffraction of textured films J. Appl. Cryst. 2008, 41, 262-271. doi: 10.1107/S0021889808001064
- Lu, X.; Yager, K.G.; Johnston, D.; Black, C.T.; Ocko, B.M. Grazing-incidence transmission X-ray scattering: surface scattering in the Born approximation Journal of Applied Crystallography 2013, 46, 165–172. doi: 10.1107/S0021889812047887
See Also
- DWBA
- Simulating X-ray diffraction of textured films D. W. Breiby, O. Bunk, J. W. Andreasen, H. T. Lemke and M. M. Nielsen J. Appl. Cryst. 2008, 41, 262-271. doi: 10.1107/S0021889808001064
- Indexation scheme for oriented molecular thin films studied with grazing-incidence reciprocal-space mapping D.-M. Smilgies and D. R. Blasini J. Appl. Cryst. 2007, 40, 716-718. doi: 10.1107/S0021889807023382
- Grazing-incidence small-angle X-ray scattering from thin polymer films with lamellar structures - the scattering cross section in the distorted-wave Born approximation P. Busch, M. Rauscher, D.-M. Smilgies, D. Posselt and C. M. Papadakis J. Appl. Cryst. 2006, 39, 433-442. doi: 10.1107/S0021889806012337