CMS

The Complex Materials Scattering (CMS) beamline at NSLS-II is a synchrotron instrument focused on x-ray scattering. It is located at 11-BM (bending magnet port) on the NSLS-II floor, and features a three-pole wiggler source. It can perform SAXS and WAXS experiments, focusing on high-throughput and 'intelligent' machine-guided exploration of parameter spaces.

Capabilities

CHX can perform a variety of experiments:

• SAXS
• GISAXS
• GTSAXS
• WAXS
• GIWAXS

Performance

Energy

• Can perform experiments from 10 keV to 17 keV.
• Energy resolution (double multilayers): 10⁻³

q-range

• 0.003 Å⁻¹ to 4.2 Å⁻¹ (209 nm to 0.15 nm)

Resolution

Ultimate resolution (detector pixel limited) is 0.0002 Å⁻¹.

beam size (mm)	beam divergence (mrad)	pixel size (mm)	pixel FW @ 5 m (mrad)	pixel FW @ 5 m, 13.5 keV (Å−1)	resolution, FWHM (Å−1)
0.200	0.10	0.172	0.03	0.00024	0.0007
0.100	0.05	0.172	0.03	0.00024	0.0002

• C.f. Olog: test of diffraction grating (80 nm pitch).

Flux

Full Beam

At start of endstation (bim3 ionchamber):

• 1.6 ×10¹² ph/s/0.1%bw (1.5 × 0.1 mrad; diagnostic mesh in-place; 13.5 keV, 250 mA ring current)
• 1.5 ×11¹¹ ph/s/0.1%bw (0.1 × 0.1 mrad; 13.5 keV, 250 mA ring current)

Near sample position, full beam (no slits):

• 1.3 ×10¹² ph/s (13.5 keV, 250 mA ring current)

Normal Beam

For 13.5 keV, 250 mA ring current:

S4 slits size (mm)	beam divergence (mrad)	beam size at sample position (μm)	beam flux at sample/detector (ph/s)	olog
1.000 H × 1.000 V	0.10 H × 0.10 V		2.1×1011	834_2
0.200 H × 0.200 V	0.10 H × 0.10 V		1.2×1011	834_2
0.100 H × 0.100 V	0.10 H × 0.10 V		3.4×1010	834_2
0.050 H × 0.050 V	0.10 H × 0.10 V		8.6×109	834_2
0.020 H × 0.020 V	0.10 H × 0.10 V		1.1×109	834_2
0.100 H × 0.020 V	0.10 H × 0.10 V		5.4×109	834_2
0.100 H × 0.010 V	0.10 H × 0.10 V		1.9×109	834_2

Small Beam

For 13.5 keV, 250 mA ring current:

S4 slits size (mm)	beam divergence (mrad)	beam V size at sample position (μm)	beam flux at sample/detector (ph/s)	olog
0.100 H × 0.010 V	0.10 H × 0.10 V	33	2×109	819_1
0.100 H × 0.010 V	0.10 H × 0.05 V	22	1×109	821_1

• With divergence of 0.1 mrad H x 0.05 mrad V and S4 beam size of 0.1 mm H x 0.01 mm V, "knife-edge" smy scan implies beam FWHM of ~ 22 um V at sample and flux of 1e+9 cts/s as measured at Pilatus (with attenuation factor included).

With divergence of 0.1 mrad H x 0.1 mrad V and S4 beam size of 0.1 mm H x 0.01 mm V, "knife-edge" smy scan implies beam FWHM of ~ 33 um V at sample and flux of 2e+9 cts/s as measured at

Beam Size

• Typical 50-100 µm
• Beam can be shaped (using slits) to 10 µm.

Configuration

CMS is a flexible SAXS/WAXS instrument. The instrument has two detectors (SAXS and WAXS) that can be repositioned as needed for experiments. The sample environment is flexible, with the ability to measure samples in vacuum or in air.

• CMS:Sample area

CMS can accommodate a wide range of sample holders and customized (in-situ or operando) sample environments.

• CMS:Sample environments

Access

CMS has taken 'first light' and is currently completing technical commissioning. General User access is scheduled for summer 2017. Access will be possible through the NSLS-II proposal system, and through the CFN proposal system. Interested users should contact beamline staff.

Contact

• Beamline phone number: 631-344-1911

Beamline Staff

Masa Fukuto (beamline lead) email: fukuto@bnl.gov office phone: 631-344-5256 office location: Bldg. 744 (green LOB of NSLS-II), room 4L108
Ruipeng Li (beamline staff) email: rli@bnl.gov office phone: 631-344-???? office location: Bldg. 744 (green LOB of NSLS-II), room 4L140
Kevin Yager (partner user beamline staff) email: kyager@bnl.gov office phone: 631-344-7608 office location: Bldg. 735 (CFN), room 2018 (2nd floor, east side)

Training

• Beamline Specific Training Form

Software

• The CMS beamline configuration is stored at: https://github.com/NSLS-II-CMS.
• See Software for a list of software useful in SAXS/WAXS experiments.

See Also

• Official site