Difference between revisions of "Technical articles"
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==Scattering techniques== | ==Scattering techniques== | ||
| − | * [[SAXS]]/[[SANS]] | + | * Small-angle scattering (SAS), [[SAXS]]/[[SANS]] |
** [[USAXS]]/[[USANS]] | ** [[USAXS]]/[[USANS]] | ||
** [[CD-SAXS]]/[[RSANS]] | ** [[CD-SAXS]]/[[RSANS]] | ||
| Line 14: | Line 14: | ||
* [[Resonant scattering]] (a.k.a. anomalous scattering) | * [[Resonant scattering]] (a.k.a. anomalous scattering) | ||
** [[RSoXS]] | ** [[RSoXS]] | ||
| + | ** [[Resonant reflectivity]] | ||
* [[Diffraction]] | * [[Diffraction]] | ||
** [[Crystallography]] | ** [[Crystallography]] | ||
| Line 22: | Line 23: | ||
* [[Coherent Diffraction Imaging]] ([[CDI]]) | * [[Coherent Diffraction Imaging]] ([[CDI]]) | ||
* [[Ptycography]] | * [[Ptycography]] | ||
| + | * [[X-ray cross-correlation analysis]] ([[XCCA]]) | ||
==Kinds of scattering== | ==Kinds of scattering== | ||
| Line 63: | Line 65: | ||
* [[Lattices of nano-objects]] | * [[Lattices of nano-objects]] | ||
| − | ==Instrumental== | + | ==[[Instrumental]]== |
| − | * | + | * X-ray sources |
| − | ** [[ | + | ** [[Labscale]] |
** [[Synchrotron]] | ** [[Synchrotron]] | ||
** X-ray free-electron laser ([[XFEL]]) | ** X-ray free-electron laser ([[XFEL]]) | ||
| − | * [[ | + | * [[Instrumental resolution]] |
| + | * [[X-ray focusing]] | ||
* [[Detectors]] | * [[Detectors]] | ||
Latest revision as of 15:33, 11 November 2016
This page lists the various technical topics that are described on this wiki. Note that many of the topics are currently empty (red links); if you feel qualified, please jump in and contribute!
Contents
Scattering techniques
- Small-angle scattering (SAS), SAXS/SANS
- WAXS
- GISAXS
- GIWAXS
- Reflectivity
- Resonant scattering (a.k.a. anomalous scattering)
- Diffraction
Related techniques
- X-ray Photon Correlation Spectroscopy (XPCS)
- Coherent Diffraction Imaging (CDI)
- Ptycography
- X-ray cross-correlation analysis (XCCA)
Kinds of scattering
Scattering concepts
Important quantities
- Atomic scattering factors
- Scattering Length Density (SLD)
- Critical angle
- Refractive index
- Absorption length
- Properties of materials
Analysis
- Scattering models (to fit your data with)
- Scherrer grain size analysis
- Ring graininess analysis (to determine grain count, grain size and size-distribution, crystallinity, etc.)
- Attenuation correction for sample shape
Theory
Instrumental
- X-ray sources
- Labscale
- Synchrotron
- X-ray free-electron laser (XFEL)
- Instrumental resolution
- X-ray focusing
- Detectors
