Difference between revisions of "Technical articles"
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** [[USAXS]]/[[USANS]] | ** [[USAXS]]/[[USANS]] | ||
** [[CD-SAXS]]/[[RSANS]] | ** [[CD-SAXS]]/[[RSANS]] | ||
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* [[WAXS]] | * [[WAXS]] | ||
* [[GISAXS]] | * [[GISAXS]] | ||
Revision as of 13:34, 16 December 2014
This page lists the various technical topics that are described on this wiki. Note that many of the topics are currently empty (red links); if you feel qualified, please jump in and contribute!
Contents
Scattering techniques
Related techniques
Kinds of scattering
Scattering concepts
- Scattering
- Momentum transfer
- Fourier transform
- Lattice
- Unit cell
- Reciprocal-space
- Ewald sphere
- Integrated intensity
Important quantities
- Atomic scattering factors
- Scattering Length Density (SLD)
- Critical angle
- Refractive index
- Absorption length
- Properties of materials
Analysis
- Scherrer grain size analysis
- Ring graininess analysis (to determine grain count, grain size and size-distribution, crystallinity, etc.)
- Attenuation correction for sample shape
