Difference between revisions of "Technical articles"
KevinYager (talk | contribs) (→Analysis) |
KevinYager (talk | contribs) (→Analysis) |
||
Line 52: | Line 52: | ||
==Analysis== | ==Analysis== | ||
− | * [[Scattering models]] | + | * [[Scattering models]] (to fit your data with) |
* [[Scherrer grain size analysis]] | * [[Scherrer grain size analysis]] | ||
* [[Ring graininess]] analysis (to determine grain count, grain size and size-distribution, crystallinity, etc.) | * [[Ring graininess]] analysis (to determine grain count, grain size and size-distribution, crystallinity, etc.) |
Revision as of 12:37, 10 April 2015
This page lists the various technical topics that are described on this wiki. Note that many of the topics are currently empty (red links); if you feel qualified, please jump in and contribute!
Contents
Scattering techniques
- SAXS/SANS
- WAXS
- GISAXS
- GIWAXS
- Reflectivity
- Resonant scattering (a.k.a. anomalous scattering)
- Diffraction
Related techniques
Kinds of scattering
Scattering concepts
Important quantities
- Atomic scattering factors
- Scattering Length Density (SLD)
- Critical angle
- Refractive index
- Absorption length
- Properties of materials
Analysis
- Scattering models (to fit your data with)
- Scherrer grain size analysis
- Ring graininess analysis (to determine grain count, grain size and size-distribution, crystallinity, etc.)
- Attenuation correction for sample shape