Difference between revisions of "Technical articles"
KevinYager (talk | contribs) (→Analysis) |
KevinYager (talk | contribs) (→Scattering techniques) |
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* [[Diffraction]] | * [[Diffraction]] | ||
** [[Crystallography]] | ** [[Crystallography]] | ||
| − | *** [[Macromolecular Crystallography]] | + | *** [[Macromolecular Crystallography]] ([[MX]]) |
| + | *** [[Serial Femtosecond Crystallography]] ([[SFX]]) | ||
===Related techniques=== | ===Related techniques=== | ||
* [[X-ray Photon Correlation Spectroscopy]] ([[XPCS]]) | * [[X-ray Photon Correlation Spectroscopy]] ([[XPCS]]) | ||
Revision as of 10:15, 6 May 2015
This page lists the various technical topics that are described on this wiki. Note that many of the topics are currently empty (red links); if you feel qualified, please jump in and contribute!
Contents
Scattering techniques
- SAXS/SANS
- WAXS
- GISAXS
- GIWAXS
- Reflectivity
- Resonant scattering (a.k.a. anomalous scattering)
- Diffraction
Related techniques
Kinds of scattering
Scattering concepts
Important quantities
- Atomic scattering factors
- Scattering Length Density (SLD)
- Critical angle
- Refractive index
- Absorption length
- Properties of materials
Analysis
- Scattering models (to fit your data with)
- Scherrer grain size analysis
- Ring graininess analysis (to determine grain count, grain size and size-distribution, crystallinity, etc.)
- Attenuation correction for sample shape
