Difference between revisions of "Technical articles"
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* [[DWBA]] | * [[DWBA]] | ||
* [[Lattices of nano-objects]] | * [[Lattices of nano-objects]] | ||
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+ | ==Instrumental== | ||
+ | * '''Sources''' | ||
+ | ** [[labscale]] | ||
+ | ** [[Synchrotron]] | ||
+ | ** X-ray free-electron laser ([[XFEL]]) | ||
+ | * [[Resolution]] | ||
+ | * [[Detectors]] |
Revision as of 10:16, 6 May 2015
This page lists the various technical topics that are described on this wiki. Note that many of the topics are currently empty (red links); if you feel qualified, please jump in and contribute!
Contents
Scattering techniques
- SAXS/SANS
- WAXS
- GISAXS
- GIWAXS
- Reflectivity
- Resonant scattering (a.k.a. anomalous scattering)
- Diffraction
Related techniques
Kinds of scattering
Scattering concepts
Important quantities
- Atomic scattering factors
- Scattering Length Density (SLD)
- Critical angle
- Refractive index
- Absorption length
- Properties of materials
Analysis
- Scattering models (to fit your data with)
- Scherrer grain size analysis
- Ring graininess analysis (to determine grain count, grain size and size-distribution, crystallinity, etc.)
- Attenuation correction for sample shape
Theory
Instrumental
- Sources
- labscale
- Synchrotron
- X-ray free-electron laser (XFEL)
- Resolution
- Detectors