Difference between revisions of "Technical articles"
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==Instrumental== | ==Instrumental== | ||
− | * | + | * X-ray sources |
− | ** [[ | + | ** [[Labscale]] |
** [[Synchrotron]] | ** [[Synchrotron]] | ||
** X-ray free-electron laser ([[XFEL]]) | ** X-ray free-electron laser ([[XFEL]]) | ||
− | * [[ | + | * [[Instrumental resolution]] |
* [[Detectors]] | * [[Detectors]] |
Revision as of 10:17, 6 May 2015
This page lists the various technical topics that are described on this wiki. Note that many of the topics are currently empty (red links); if you feel qualified, please jump in and contribute!
Contents
Scattering techniques
- SAXS/SANS
- WAXS
- GISAXS
- GIWAXS
- Reflectivity
- Resonant scattering (a.k.a. anomalous scattering)
- Diffraction
Related techniques
Kinds of scattering
Scattering concepts
Important quantities
- Atomic scattering factors
- Scattering Length Density (SLD)
- Critical angle
- Refractive index
- Absorption length
- Properties of materials
Analysis
- Scattering models (to fit your data with)
- Scherrer grain size analysis
- Ring graininess analysis (to determine grain count, grain size and size-distribution, crystallinity, etc.)
- Attenuation correction for sample shape
Theory
Instrumental
- X-ray sources
- Labscale
- Synchrotron
- X-ray free-electron laser (XFEL)
- Instrumental resolution
- Detectors