Difference between revisions of "Technical articles"
KevinYager (talk | contribs) (→Instrumental) |
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==Scattering techniques== | ==Scattering techniques== | ||
− | * [[SAXS]]/[[SANS]] | + | * Small-angle scattering (SAS), [[SAXS]]/[[SANS]] |
** [[USAXS]]/[[USANS]] | ** [[USAXS]]/[[USANS]] | ||
** [[CD-SAXS]]/[[RSANS]] | ** [[CD-SAXS]]/[[RSANS]] |
Revision as of 10:18, 6 May 2015
This page lists the various technical topics that are described on this wiki. Note that many of the topics are currently empty (red links); if you feel qualified, please jump in and contribute!
Contents
Scattering techniques
- Small-angle scattering (SAS), SAXS/SANS
- WAXS
- GISAXS
- GIWAXS
- Reflectivity
- Resonant scattering (a.k.a. anomalous scattering)
- Diffraction
Related techniques
Kinds of scattering
Scattering concepts
Important quantities
- Atomic scattering factors
- Scattering Length Density (SLD)
- Critical angle
- Refractive index
- Absorption length
- Properties of materials
Analysis
- Scattering models (to fit your data with)
- Scherrer grain size analysis
- Ring graininess analysis (to determine grain count, grain size and size-distribution, crystallinity, etc.)
- Attenuation correction for sample shape
Theory
Instrumental
- X-ray sources
- Labscale
- Synchrotron
- X-ray free-electron laser (XFEL)
- Instrumental resolution
- Detectors