Technical articles

This page lists the various technical topics that are described on this wiki. Note that many of the topics are currently empty (red links); if you feel qualified, please jump in and contribute!

Scattering techniques

• Small-angle scattering (SAS), SAXS/SANS
  • USAXS/USANS
  • CD-SAXS/RSANS
  • BioSAXS
• WAXS
• GISAXS
  • X-ray waveguiding
  • GTSAXS
• GIWAXS
• Reflectivity
• Resonant scattering (a.k.a. anomalous scattering)
  • RSoXS
  • Resonant reflectivity
• Diffraction
  • Crystallography
    • Macromolecular Crystallography (MX)
    • Serial Femtosecond Crystallography (SFX)

Related techniques

• X-ray Photon Correlation Spectroscopy (XPCS)
• Coherent Diffraction Imaging (CDI)
• Ptycography
• X-ray cross-correlation analysis (XCCA)

Kinds of scattering

• Form Factor
• Structure Factor
  • Lattice Factor
• Diffuse scattering
• Debye-Waller factor
• Scattering intensity

Scattering concepts

• Scattering
  • Scattering intensity
  • Integrated intensity
• Reciprocal-space
  • Fourier transform
  • Momentum transfer
    • q value
  • Ewald sphere
• Real-space
  • Lattice
  • Unit cell

Important quantities

• Atomic scattering factors
• Scattering Length Density (SLD)
• Critical angle
• Refractive index
• Absorption length
• Properties of materials

Analysis

• Scattering models (to fit your data with)
• Scherrer grain size analysis
• Ring graininess analysis (to determine grain count, grain size and size-distribution, crystallinity, etc.)
• Attenuation correction for sample shape

Theory

• Born Approximation
• DWBA
• Lattices of nano-objects

Instrumental

• X-ray sources
  • Labscale
  • Synchrotron
  • X-ray free-electron laser (XFEL)
• Instrumental resolution
• X-ray focusing
• Detectors