This page provides tutorials (basic and advanced) to help GISAXS users with experiment design, data analysis, and data modeling:
Slides from Presentations
- Theory of GISAXS, Zhang Jiang (Advanced Photon Source, Argonne National Laboratory): Introduction to the theoretical methods required for correctly analyzing and modeling GISAXS data, including the DWBA and waveguide effects.
- GIXS: hands-on data analysis, Joe Strzalka (Advanced Photon Source, Argonne National Laboratory): An introduction to practical aspects of interpreting and analyzing grazing-incidence data, including the use of GIXSGUI software.
- GISAXS/GIWAXS Data Analysis: Thinking in Reciprocal-Space, Kevin Yager (National Synchrotron Light Source and Center for Functional Nanomaterials, Brookhaven National Laboratory): An introduction to the interpretation and basic analysis of GISAXS data, in particular in relation to the concept of how the experiment probes a slice through the 3D reciprocal-space.
- Synchrotron Scattering for Study of Soft Systems, Kevin Yager (National Synchrotron Light Source and Center for Functional Nanomaterials, Brookhaven National Laboratory): An brief tutorial/introduction to how x-ray scattering functions. Selected examples of using SAXS and GISAXS to study soft and hybrid systems is then presented. Finally, a few emerging methods are presented, to demonstrate how to go beyond conventional scattering approaches.
- GISAS Data Analysis with BornAgain, Walter Van Herck (Jülich Centre for Neutron Science JCNS, Germany): Description of how to use the BornAgain software for quantitatively modeling and fitting GISAXS data.
- High performance GISAXS, Alexander Hexemer (Advanced Light Source, Lawrence Berkeley National Laboratory): Description of recent developments in the high-throughput and high-performance modeling of GISAXS data, in particular describing the HipGISAXS software.
A Massive Open Online Course (MOOC) from the EPFL (Ecole Polytechnique Federale de Lausanne), covering introductory aspects of synchrotron and XFEL radiation is being offered:
The course begins 5th March 2018 and lasts for nine weeks. The course is aimed at a broad audience and includes the following themes:
- Interaction of x-rays with matter;
- The production and physics of synchrotron and XFEL radiation;
- X-ray optics, beamlines, and instrumentation;
- X-ray diffraction and scattering;
- UV and x-ray spectroscopies;
- X -ray imaging (mainly tomography and lensless imaging/ptychography);
- Extra week on phasing techniques in macromolecular crystallography.
Frequently Asked Questions
- What are the sample/substrate requirements for GISAXS?
- How long does it take to measure a sample?
- What do I do with my data?
- What software is available for analysis?
- Why does sample orientation matter?
- What's that missing wedge (near qz axis) in my processed data?
- GISAXS is complicated. Why not just do microscopy?
- Scattering models
- Polymer clustering or gel mesh size from SANS
- Orientation analysis (using P3HT as an example)
- Particle spacing from peak position
- Porod plot ()
- Fresnel plot ()
- Kratky plot ()
- Debye scaling ()
- Rod-like scaling ()
- Guinier plot ()
- Zimm plot
- What's the difference between scattering and diffraction? SAXS and WAXS?
- Why are there oscillations below the critical angle in my reflectivity curve?