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* '''[http://gisaxs.com/files/Strzalka.pdf GIXS: hands-on data analysis]''', Joe Strzalka ([[APS|Advanced Photon Source]], Argonne National Laboratory): An introduction to practical aspects of interpreting and analyzing grazing-incidence data, including the use of [[GIXSGUI]] software. | * '''[http://gisaxs.com/files/Strzalka.pdf GIXS: hands-on data analysis]''', Joe Strzalka ([[APS|Advanced Photon Source]], Argonne National Laboratory): An introduction to practical aspects of interpreting and analyzing grazing-incidence data, including the use of [[GIXSGUI]] software. | ||
* '''[http://gisaxs.com/files/YagerACA_05.pdf GISAXS/GIWAXS Data Analysis: Thinking in Reciprocal-Space]''', [[Kevin Yager]] ([[National Synchrotron Light Source]] and Center for Functional Nanomaterials, [[BNL|Brookhaven National Laboratory]]): An introduction to the interpretation and basic analysis of GISAXS data, in particular in relation to the concept of how the experiment probes a slice through the 3D [[reciprocal-space]]. | * '''[http://gisaxs.com/files/YagerACA_05.pdf GISAXS/GIWAXS Data Analysis: Thinking in Reciprocal-Space]''', [[Kevin Yager]] ([[National Synchrotron Light Source]] and Center for Functional Nanomaterials, [[BNL|Brookhaven National Laboratory]]): An introduction to the interpretation and basic analysis of GISAXS data, in particular in relation to the concept of how the experiment probes a slice through the 3D [[reciprocal-space]]. | ||
| + | * '''[http://gisaxs.com/files/Yager-2016_xray_soft_matter.pdf Synchrotron Scattering for Study of Soft Systems]''', [[Kevin Yager]] ([[National Synchrotron Light Source]] and Center for Functional Nanomaterials, [[BNL|Brookhaven National Laboratory]]): A brief tutorial/introduction to how [[x-ray]] [[scattering]] functions. Selected examples of using [[SAXS]] and [[GISAXS]] to study soft and hybrid systems is then presented. Finally, a few emerging methods are presented, to demonstrate how to go beyond conventional scattering approaches. | ||
* '''[http://gisaxs.com/files/Van%20Herck_DataAnalysisWithBA.pdf GISAS Data Analysis with BornAgain]''', Walter Van Herck (Jülich Centre for Neutron Science JCNS, Germany): Description of how to use the [[BornAgain]] software for quantitatively modeling and fitting GISAXS data. | * '''[http://gisaxs.com/files/Van%20Herck_DataAnalysisWithBA.pdf GISAS Data Analysis with BornAgain]''', Walter Van Herck (Jülich Centre for Neutron Science JCNS, Germany): Description of how to use the [[BornAgain]] software for quantitatively modeling and fitting GISAXS data. | ||
* '''[http://gisaxs.com/files/2014_Hexemer.pdf High performance GISAXS]''', Alexander Hexemer ([[ALS|Advanced Light Source]], Lawrence Berkeley National Laboratory): Description of recent developments in the high-throughput and high-performance modeling of GISAXS data, in particular describing the [[HipGISAXS]] software. | * '''[http://gisaxs.com/files/2014_Hexemer.pdf High performance GISAXS]''', Alexander Hexemer ([[ALS|Advanced Light Source]], Lawrence Berkeley National Laboratory): Description of recent developments in the high-throughput and high-performance modeling of GISAXS data, in particular describing the [[HipGISAXS]] software. | ||
| + | |||
| + | ==Educational== | ||
| + | * [http://journals.iucr.org/j/issues/2018/06/00/gj5217/index.html EwaldSphere: an interactive approach to teaching the Ewald sphere construction] ''J. Appl. Cryst.'' '''2018''' [https://doi.org/10.1107/S1600576718012876 doi: 10.1107/S1600576718012876] | ||
| + | ** [http://academic.sun.ac.za/barbour/Software.html Web-site with software and presentation slides for these concepts.] | ||
| + | |||
| + | ==Courses== | ||
| + | ===EPFL MOOC=== | ||
| + | A Massive Open Online Course (MOOC) from the EPFL (Ecole Polytechnique Federale de Lausanne), covering introductory aspects of synchrotron and XFEL radiation is being offered: | ||
| + | * [https://www.edx.org/course/synchrotrons-and-x-ray-free-electron-lasers https://www.edx.org/course/synchrotrons-and-x-ray-free-electron-lasers] | ||
| + | |||
| + | The course begins '''5th March 2018''' and lasts for nine weeks. The course is aimed at a broad audience and includes the following themes: | ||
| + | # Interaction of x-rays with matter; | ||
| + | # The production and physics of synchrotron and XFEL radiation; | ||
| + | # X-ray optics, beamlines, and instrumentation; | ||
| + | # X-ray diffraction and scattering; | ||
| + | # UV and x-ray spectroscopies; | ||
| + | # X -ray imaging (mainly tomography and lensless imaging/ptychography); | ||
| + | # Extra week on phasing techniques in macromolecular crystallography. | ||
==Frequently Asked Questions== | ==Frequently Asked Questions== | ||
* [[GISAXS sample requirements|What are the sample/substrate requirements for GISAXS?]] | * [[GISAXS sample requirements|What are the sample/substrate requirements for GISAXS?]] | ||
* [[GISAXS measurement time|How long does it take to measure a sample?]] | * [[GISAXS measurement time|How long does it take to measure a sample?]] | ||
| + | ** [[Radiation damage|Do I need to worry about beam damage?]] | ||
* [[Tutorial:What to do with data|What do I do with my data?]] | * [[Tutorial:What to do with data|What do I do with my data?]] | ||
** [[Tutorial:Qualitative inspection|Qualitative inspection]] | ** [[Tutorial:Qualitative inspection|Qualitative inspection]] | ||
| + | *** [[Scattering features]] | ||
** [[Tutorial:Linecuts|Linecuts]] | ** [[Tutorial:Linecuts|Linecuts]] | ||
** [[Background|Background subtraction]] | ** [[Background|Background subtraction]] | ||
| + | ** [[Tutorial:Indexing|Peak Indexing]] | ||
| + | ** [[Tutorial:Modeling|Modeling]] | ||
| + | ** [[Tutorial:Fitting|Data Fitting]] | ||
* [[Software|What software is available for analysis?]] | * [[Software|What software is available for analysis?]] | ||
| − | * [[ | + | * [[Sample orientation|Why does sample orientation matter?]] |
| + | * [[GI missing wedge|What's that missing wedge (near qz axis) in my processed data?]] | ||
| + | * [[Scattering vs. microscopy|GISAXS is complicated. Why not just do microscopy?]] | ||
==Data Analysis== | ==Data Analysis== | ||
| + | * [[Scattering models]] | ||
| + | * [[Example:Polymer clustering|Polymer clustering or gel mesh size from SANS]] | ||
* [[Example:P3HT orientation analysis|Orientation analysis (using P3HT as an example)]] | * [[Example:P3HT orientation analysis|Orientation analysis (using P3HT as an example)]] | ||
* [[Example:Particle spacing from peak position|Particle spacing from peak position]] | * [[Example:Particle spacing from peak position|Particle spacing from peak position]] | ||
| + | |||
| + | ===Scaling Analysis=== | ||
| + | * [[Porod plot]] (<math>\scriptstyle I \sim q^{-4}</math>) | ||
| + | * [[Fresnel plot]] (<math>\scriptstyle R \sim q^{-4}</math>) | ||
| + | * [[Kratky plot]] (<math>\scriptstyle I \sim q^{-2}</math>) | ||
| + | * [[Debye scaling]] (<math>\scriptstyle I \sim q^{-2}</math>) | ||
| + | * [[Rod-like scaling]] (<math>\scriptstyle I \sim q^{-1}</math>) | ||
| + | * [[Guinier plot]] (<math>\scriptstyle \ln(I) \sim 1 - (R_g^2/3)q^{2} </math>) | ||
| + | * [[Zimm plot]] | ||
==Experimental Help== | ==Experimental Help== | ||
* [[GISAXS alignment]] | * [[GISAXS alignment]] | ||
* [[Grating alignment]] | * [[Grating alignment]] | ||
| + | |||
| + | ==Miscellaneous Questions== | ||
| + | * [[Definitional boundaries|What's the difference between scattering and diffraction? SAXS and WAXS?]] | ||
| + | * [[Reflectivity oscillations below critical angle|Why are there oscillations below the critical angle in my reflectivity curve?]] | ||
==See Also== | ==See Also== | ||
Latest revision as of 08:44, 29 January 2019
This page provides tutorials (basic and advanced) to help GISAXS users with experiment design, data analysis, and data modeling:
Contents
Slides from Presentations
- Theory of GISAXS, Zhang Jiang (Advanced Photon Source, Argonne National Laboratory): Introduction to the theoretical methods required for correctly analyzing and modeling GISAXS data, including the DWBA and waveguide effects.
- GIXS: hands-on data analysis, Joe Strzalka (Advanced Photon Source, Argonne National Laboratory): An introduction to practical aspects of interpreting and analyzing grazing-incidence data, including the use of GIXSGUI software.
- GISAXS/GIWAXS Data Analysis: Thinking in Reciprocal-Space, Kevin Yager (National Synchrotron Light Source and Center for Functional Nanomaterials, Brookhaven National Laboratory): An introduction to the interpretation and basic analysis of GISAXS data, in particular in relation to the concept of how the experiment probes a slice through the 3D reciprocal-space.
- Synchrotron Scattering for Study of Soft Systems, Kevin Yager (National Synchrotron Light Source and Center for Functional Nanomaterials, Brookhaven National Laboratory): A brief tutorial/introduction to how x-ray scattering functions. Selected examples of using SAXS and GISAXS to study soft and hybrid systems is then presented. Finally, a few emerging methods are presented, to demonstrate how to go beyond conventional scattering approaches.
- GISAS Data Analysis with BornAgain, Walter Van Herck (Jülich Centre for Neutron Science JCNS, Germany): Description of how to use the BornAgain software for quantitatively modeling and fitting GISAXS data.
- High performance GISAXS, Alexander Hexemer (Advanced Light Source, Lawrence Berkeley National Laboratory): Description of recent developments in the high-throughput and high-performance modeling of GISAXS data, in particular describing the HipGISAXS software.
Educational
- EwaldSphere: an interactive approach to teaching the Ewald sphere construction J. Appl. Cryst. 2018 doi: 10.1107/S1600576718012876
Courses
EPFL MOOC
A Massive Open Online Course (MOOC) from the EPFL (Ecole Polytechnique Federale de Lausanne), covering introductory aspects of synchrotron and XFEL radiation is being offered:
The course begins 5th March 2018 and lasts for nine weeks. The course is aimed at a broad audience and includes the following themes:
- Interaction of x-rays with matter;
- The production and physics of synchrotron and XFEL radiation;
- X-ray optics, beamlines, and instrumentation;
- X-ray diffraction and scattering;
- UV and x-ray spectroscopies;
- X -ray imaging (mainly tomography and lensless imaging/ptychography);
- Extra week on phasing techniques in macromolecular crystallography.
Frequently Asked Questions
- What are the sample/substrate requirements for GISAXS?
- How long does it take to measure a sample?
- What do I do with my data?
- What software is available for analysis?
- Why does sample orientation matter?
- What's that missing wedge (near qz axis) in my processed data?
- GISAXS is complicated. Why not just do microscopy?
Data Analysis
- Scattering models
- Polymer clustering or gel mesh size from SANS
- Orientation analysis (using P3HT as an example)
- Particle spacing from peak position
Scaling Analysis
- Porod plot ()
- Fresnel plot ()
- Kratky plot ()
- Debye scaling ()
- Rod-like scaling ()
- Guinier plot ()
- Zimm plot
Experimental Help
Miscellaneous Questions
- What's the difference between scattering and diffraction? SAXS and WAXS?
- Why are there oscillations below the critical angle in my reflectivity curve?
